This article is rated Stub-class on Wikipedia's content assessment scale. It is of interest to the following WikiProjects: | |||||||||||
|
Starting new article issued an important semiconductor phenomenon. Your comments are appreciated.
Characterization edit
What kinds of characterization techniques can be used to measure carrier lifetime in the laboratory? Can Capacitance-Voltage Profiling give you carrier lifetime? —Preceding unsigned comment added by 131.183.20.100 (talk) 01:09, 21 December 2009 (UTC) hjkh
Equation edit
In the only equation: what is N and what is the index n? LarsWinterfeld (talk) 15:15, 5 August 2015 (UTC)