Elyse Rosenbaum is an American electrical engineer, the Melvin and Anne Louise Hassebrock Professor in Electrical and Computer Engineering at the University of Illinois Urbana-Champaign, and the director of the Center for Advanced Electronics through Machine Learning.[1] Her research involves the reliability of integrated circuits, including modeling the effects of heat, electrostatic discharges, aging, and other forms of stress on semiconductor-based circuit components.[2]
Education and career
editRosenbaum earned a bachelor's degree from Cornell University and a master's degree from Stanford University, in 1984 and 1985 respectively,[3] and became a researcher at Bell Labs.[2] Returning to graduate study, she completed a Ph.D. in 1992 at the University of California, Berkeley.[1] Her dissertation, Thin oxide reliability in integrated circuits, was supervised by Chenming Hu.[3]
She has been a faculty member at the University of Illinois Urbana-Champaign since 1992,[2] and was named Melvin and Anne Louise Hassebrock Professor in 2016.[1]
Recognition
editRosenbaum was named an IEEE Fellow in 2011, "for contributions to electrostatic discharge reliability of integrated circuits".[4]
She received the Industry Pioneer Award in 2017, at the 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).[5]
References
edit- ^ a b c "Elyse Rosenbaum", Faculty directory, Illinois Electrical & Computer Engineering, retrieved 2024-07-16
- ^ a b c "Elyse Rosenbaum", Experts, Illinois Electrical & Computer Engineering, retrieved 2024-07-16
- ^ a b Rosenbaum, Elyse (1992), Thin oxide reliability in integrated circuits (PhD thesis), University of California, Berkeley, ProQuest 303998245
- ^ IEEE Fellows directory, IEEE, retrieved 2024-07-16
- ^ "Industry Pioneer Award: Elyse Rosenbaum", 2017 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), IEEE, September 2017, p. 1, doi:10.23919/eosesd.2017.8073470, ISBN 978-1-58537-293-5