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Summary
| Description |
English: Description of the transfer length method (TLM) for determining the contact resistivity of metal-semiconductor junctions |
| Date | |
| Source | Own work |
| Author | Galaktico |
Licensing
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File history
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 21:26, 10 November 2022 | | 640 × 404 (26 KB) | Galaktico | Transfer length added |
| 18:25, 10 November 2022 |  | 640 × 404 (25 KB) | Galaktico | Uploaded while editing "File:Tlm article graphics.png" on commons.wikimedia.org |
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