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Summary
edit(a) Superimposed photocurrent map and three-dimensional film topography collected from a conductive AFM tip (diamond coated) while under short circuit conditions. (b) Reduced scan area which depict local current-voltage measurements found in (c).
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| Date/Time | Thumbnail | Dimensions | User | Comment | |
|---|---|---|---|---|---|
| current | 19:43, 4 May 2011 | | 570 × 1,278 (182 KB) | SIUCchem575 (talk | contribs) | (a) Superimposed photocurrent map and three-dimensional film topography collected from a conductive AFM tip (diamond coated) while under short circuit conditions. (b) Reduced scan area which depict local current-voltage measurements in (c). License Numb |
| 19:22, 4 May 2011 |  | 570 × 1,278 (182 KB) | SIUCchem575 (talk | contribs) | (a) Superimposed photocurrent map and three-dimensional film topography collected from a conductive AFM tip (diamond coated) while under short circuit conditions. (b) Reduced scan area which depict local current-voltage measurements found in (c). |
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